Notes from the lab.

Research note: the surprising overlap between transformer inference optimization and semiconductor yield engineering.

• transformers
• inference
• semiconductors

Research note: retrieval, citations, and the trust architecture required before process engineers will use an AI assistant.

• LLMs
• RAG
• trust

Experiment log: treating die-level wafer maps as images unlocks the entire computer vision toolbox for yield analysis.

• computer vision
• yield
• experiments